Measuring Prisms with Apre’s Spectrally Controlled Interferometry (SCI)
Prisms are complex optical components. Transmitted wavefront performance is controlled by multiple surfaces, the angle between them, and the material’s homogeneity. Spectrally Controlled Interferometry (SCI) available from Apres Instruments enables their S-series interferometers to make prism measurement fast, easy and more accurate than conventional methods.
SCI simplifies and speeds up the measurement process for S1 and S2 surface flatness, transmitted wavefront and relative angles. Now these parameters can be measured in less than 5 minutes (including setup) with increased accuracy, faster cycle time and lower risk of damage to the part.
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