Measurements with a Laser Interferometer Made Easy!
To measure prisms and substrates with a laser interferometer, you are typically forced to paint or tape surfaces. Time is wasted, parts damaged, and accuracy degraded. Spectrally Controlled Interferometry (SCI) directly measures these parts down to 150 µm OPL ((or even 75 µm on special request). No taping, no painting…just measure. SCI is simply faster and more … Continue reading