Posts on this page of our Blog relate to the Systems product category.
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Optical index homogeneity is an important material parameter influencing lens performance. Laser interferometers have painstakingly measured this parameter which requires four separate measurements. Laser interferometers have either required the use of contact plates with oft times poisonous index matching fluids or polishing a wedge into the test part to isolate the front from the back … Continue reading
New zoom imaging interferometers are based on the same design as 40-year-old systems. So upgrading to the latest camera and computer systems offers the same performance as a new system at ~⅓ the cost. Äpre has saved their customers over $2,000,000 enabling them to invest and grow their businesses. An upgrade provides you with the … Continue reading
Dome optics are the last component in a growing number of imaging and guidance applications. Domes protect the imaging optics from the surrounding environment without degrading optical performance. Therefore the dome’s transmitted wavefront quality is important to control since it directly influences the final image quality. Dome applications include: Underwater cameras Submersibles for robotic and manned … Continue reading
Prism assemblies are difficult optical elements to measure. Back reflections from multiple surfaces and multiple channels make laser interferometry incapable of making these measurements. Spectrally Controlled Interferometry (SCI), available from Apre Instruments, offers an easy-to-use, accurate method to measure these components for the first time. A laser light source interferometer (for example a laser Fizeau) … Continue reading
Prisms are complex optical components. Transmitted wavefront performance is controlled by multiple surfaces, the angle between them, and the material’s homogeneity. Spectrally Controlled Interferometry (SCI) available from Apres Instruments enables their S-series interferometers to make prism measurement fast, easy and more accurate than conventional methods. SCI simplifies and speeds up the measurement process for S1 and … Continue reading
Total Thickness variation (TTV), and often wedge, is a specification of optical windows and substrates. There are two methods for measuring TTV: Front-to-Back (left image above) and Direct (right image above). Both methods utilize Fizeau interferometers, a product line of Äpre Instruments. Front-to-Back Measurement TTV can only be calculated if the front and back … Continue reading
