Posts on this page of our Blog relate to the Systems product category.
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Guernsey Coating Labs, a Ventura, CA-based company has supplied optical thin film coatings to the industry for over 40 years. Guernsey recently purchased a Zygo interferometer with an Äpre software upgrade. Ty Guernsey, President and Founder, shares how this has assisted in expanding capabilities for her company. Question: What challenges led you to invest in … Continue reading
Precise alignment of the transmission flat (TF) or transmission sphere (TS) is critical for obtaining accurate measurements. A misaligned TF/TS, that is any non-orthogonal tilt relative to the optical axis, will cause the returning beams to pass through the interferometer off axis. Off‐axis beams pick up retrace errors lowering measurement accuracy. This is especially important … Continue reading
Previously difficult measurements of right angle prisms are now possible with the spectrally controlled source (SCI). With the narrow coherence and easy setup even micro-prism measurement is possible. Measuring right angle prisms is complicated by back reflections from the multiple faces of the prism. Äpre SCI technology separates the faces, enabling easy measurement of all … Continue reading
Easily measure optical wedges using the REVEAL metrology software from Äpre Instruments. Through transmission or reflection, you can accurately determine wedge angle, tilt, magnitude, and more to get the job done right. An Application Note from Äpre teaches how to measure an optical wedge or a group of optical wedges by transmission or reflection. This … Continue reading
Äpre Instruments has released a short paper, entitled “Mid Spatial Frequencies in Optical Surfaces Based on Interferometric Measurements.” The abstract of this paper states: Modern optical polishing introduces mid-spatial frequency errors. Few standards exist to specify and measure mid-spatial frequencies. We propose Fizeau interferometry’s application characterized by power spectral density due to its flexibility and … Continue reading
Watch a demonstration of S50 Interferometer and Spectrally Controlled Light Source measuring a 200 µm thick wafer with a 0.5 inch diameter. This demonstration features Äpre Instruments’: S50 Interferometer Spectrally Controlled Light Source REVEAL Metrology Software The demonstration shows how the system measures the internal fringes, front surface fringes, and back surface fringes. About Äpre … Continue reading