Introduction to TIRF Microscopy
Total Internal Reflection Fluorescence (TIRF) microscopy restricts excitation to a thin layer near the sample surface, often less than 100 nanometers. This technique dramatically improves signal-to-noise ratio for surface-proximal imaging. That performance depends on filters and dichroics that can handle excitation energy re-entering the emission path at high angles, something standard fluorescence optics aren’t built … Continue reading






