Demo Shows Measuring of Fringes on a 200 µm Wafer

Demo Shows Measuring of Fringes on a 200 µm Wafer

Watch a demonstration of S50 Interferometer and Spectrally Controlled Light Source measuring a 200 µm thick wafer with a 0.5 inch diameter.

This demonstration features Äpre Instruments’:

• S50 Interferometer
• Spectrally Controlled Light Source
• REVEAL Metrology Software

The demonstration shows how the system measures the internal fringes, front surface fringes, and back surface fringes.

About Äpre Instruments

Äpre Instruments was founded on the belief that advancing the field of metrology can advance the field of precision optics. Their eyes are on the horizon—anticipating your and your customers’ needs for ever more advanced optics and designing the next generation of metrology equipment and reporting. Äpre manufactures interferometers and also develops and supplies interferometer software. Äpre meets today’s needs with upgrades and unmatched service, and helps you advance your capabilities for tomorrow.

To request more information or a quotation for Äpre products or service, contact IL Photonics.