Measurements with a Laser Interferometer Made Easy!
To measure prisms and substrates with a laser interferometer, you are typically forced to paint or tape surfaces. Time is wasted, parts damaged, and accuracy degraded.
Spectrally Controlled Interferometry (SCI) directly measures these parts down to 150 µm OPL ((or even 75 µm on special request). No taping, no painting…just measure. SCI is simply faster and more accurate.
A newly released white paper from Apre Instruments is entitled “Substrates, Flat Optics and Windows, Interferometer Measurement Made Easy“.
From the abstract: “Substrates, Flats, Prisms and Windows are essential optical components enabling modern technologies. Interferometric level accuracy is required, but difficult to achieve due to limitations in available interferometers. New Technology Spectrally Controlled Interferometry (SCI), combined with high resolution interferometers, removes all the limitations of the alternatives making these optics easy and fast to measure. SCI plus alternative technologies are reviewed [in this paper].”
The paper reviews SCI plus alternative technologies.
A short video also explains how easy SCI makes measuring a substrate.
To request more information or a quotation for Apre products or service, contact IL Photonics.