Measuring Prisms with Apre’s SCI
Prisms are complex optical components. Transmitted wavefront performance is controlled by multiple surfaces, the angle between them, and the material’s homogeneity. Spectrally Controlled Interferometry (SCI) available from Apres Instruments enables their S-series interferometers to make prism measurement fast, easy and more accurate than conventional methods.
SCI simplifies and speeds up the measurement process for S1 and S2 surface flatness, transmitted wavefront and relative angles. Now measurement of these parameters in less than 5 minutes (including setup) with increased accuracy, faster cycle time and lower risk of damage to the part is now possible.
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To request more information or a quotation for this or other Apre products, contact IL Photonics.