In the semiconductor industry, extremely small surface defects and particles are a major concern that reduces yield and also costs producers time and money. It is therefore critical to inspect the surface of semiconductor wafers for defects and contamination, a challenge many of Holo/Or’s customers in the semiconductor metrology industry face. One of the faster … Continue reading
Easily measure optical wedges using the REVEAL metrology software from Äpre Instruments. Through transmission or reflection, you can accurately determine wedge angle, tilt, magnitude and more to get the job done right. An Application Note from Äpre teaches how to measure an optical wedge or a group of optical wedges by transmission or reflection. This … Continue reading
Äpre Instruments has released a short paper, entitled “Mid Spatial Frequencies in Optical Surfaces Based on Interferometric Measurements.” The abstract of this paper states: Modern optical polishing introduces mid-spatial frequency errors. Few standards exist to specify and measure mid-spatial frequencies. We propose Fizeau interferometry’s application characterized by power spectral density due to its flexibility and … Continue reading
Watch a demonstration of S50 Interferometer and Spectrally Controlled Light Source measuring a 200 µm thick wafer with a 0.5 inch diameter. This demonstration features Äpre Instruments’: S50 Interferometer Spectrally Controlled Light Source REVEAL Metrology Software The demonstration shows how the system measures the internal fringes, front surface fringes, and back surface fringes. About Äpre … Continue reading
Optical manufacturing takes precision — wavefronts, form, slopes, and mid-spatial frequencies all must meet exact specifications. This can only be achieved with the help of interferometers, the primary measurement tools to ensure accuracy. However, even small variations cause disagreement within your operation. Download a white paper from Äpre Instruments to learn how you can minimize … Continue reading
Interferometers – both standard and custom – from Äpre Instruments improve your metrology capabilities so you can build capabilities and meet your customers’ demands. Choose from their S-Series interferometers and build the system that enables you to perform fast, accurate surface and wavefront measurements. There’s no room for downtime or inaccuracies when it comes to … Continue reading