Tag Archives: metrology

Measuring Mid Spatial Frequencies in Optical Surfaces

Äpre Instruments has released a short paper, entitled “Mid Spatial Frequencies in Optical Surfaces Based on Interferometric Measurements.” The abstract of this paper states: Modern optical polishing introduces mid-spatial frequency errors. Few standards exist to specify and measure mid-spatial frequencies. We propose Fizeau interferometry’s application characterized by power spectral density due to its flexibility and … Continue reading

March 6, 2023 Äpre Instruments, Blog, Interferometers, Systems

Demo Shows Measuring of Fringes on a 200 µm Wafer

Watch a demonstration of S50 Interferometer and Spectrally Controlled Light Source measuring a 200 µm thick wafer with a 0.5 inch diameter. This demonstration features Äpre Instruments’: S50 Interferometer Spectrally Controlled Light Source REVEAL Metrology Software The demonstration shows how the system measures the internal fringes, front surface fringes, and back surface fringes. About Äpre … Continue reading

February 27, 2023 Äpre Instruments, Blog, Interferometers, Systems

The Interferometer Correlation

Optical manufacturing takes precision — wavefronts, form, slopes, and mid-spatial frequencies all must meet exact specifications. This can only be achieved with the help of interferometers, the primary measurement tools to ensure accuracy. However, even small variations cause disagreement within your operation. Download a white paper from Äpre Instruments  to learn how you can minimize … Continue reading

February 12, 2023 Äpre Instruments, Blog, Interferometers, Systems

Perform Fast, Accurate Surface and Wavefront Measurements

Interferometers – both standard and custom – from Äpre Instruments improve your metrology capabilities so you can build capabilities and meet your customers’ demands. Choose from their S-Series interferometers and build the system that enables you to perform fast, accurate surface and wavefront measurements. There’s no room for downtime or inaccuracies when it comes to … Continue reading

February 6, 2023 Äpre Instruments, Blog, Interferometers, Systems
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