Infrared AFM & s-SNOM
CO2 lasers and other mid-infrared light sources are proven tools for material inspection via spectroscopic techniques. Recently atomic force microscopy (AFM) and scattering scanning nearfield optical microscopy (s-SNOM) have gained traction due to their complementary setups. These techniques can provide insight to a material’s chemical composition and optical properties while providing imaging with a spatial resolution … Continue reading