Tag Archives: wafer

Demo Shows Measuring of Fringes on a 200 µm Wafer

Watch a demonstration of S50 Interferometer and Spectrally Controlled Light Source measuring a 200 µm thick wafer with a 0.5 inch diameter. This demonstration features Äpre Instruments’: S50 Interferometer Spectrally Controlled Light Source REVEAL Metrology Software The demonstration shows how the system measures the internal fringes, front surface fringes, and back surface fringes. About Äpre … Continue reading

27-Feb-2023 Äpre Instruments, Blog, Interferometers, Systems
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